Keywords: Hybrid Metrology Computer Chip (8004261708).jpg This tiny silicon pillar measuring less than 100 nanometers along any of its sides is the sort of computer chip feature that manufacturers now can measure more precisely with NIST's hybrid metrology method which can reduce the nagging uncertainties that have long plagued industry's measurement efforts See also http //www nist gov/pml/div683/hybrid-090512 cfm www nist gov/pml/div683/hybrid-090512 cfm Credit NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/8004261708/ Hybrid Metrology Computer Chip 2012-08-31 15 59 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/8004261708 2016-09-07 01 54 49 United States Government Work Uncategorized 2016 November 1 |