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| Keywords: Nanomechanical measurements (5974656197).jpg Nanomechanical measurements model system and microimage of typical specimen a thin rigid film on elastic substrate b initial strain induces surface wrinkles parallel to stress c additional strain induces regular pattern of cracks in the film d typical specimen imaged with optical profilometer 280 X 210 micrometers Credit Chung Lee/NIST See also http //www nist gov/mml/polymers/membrane-071911 cfm www nist gov/mml/polymers/membrane-071911 cfm Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/5974656197/ Nanomechanical measurements 2011-07-19 10 04 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/5974656197 2016-09-07 02 14 10 United States Government Work Uncategorized 2016 November 30 | ||||
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