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| Keywords: Silicon Wafer (5828755632).jpg A new NIST calibration system under development used infrared laser light to precisely measure the thickness of 300 millimeter silicon wafers Changes in color within the spatial map above represent changes in wafer thickness Green represents the average wafer thickness while red orange and yellow areas are thicker and turquoise and blue areas are thinner See also http //www nist gov/public_affairs/techbeat/tb2005_0713 htm silicon_wafer www nist gov/public_affairs/techbeat/tb2005_0713 htm silicon_wafer Credit Q Wang U Griesmann/NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/5828755632/ Silicon Wafer 2005-07-11 11 25 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/5828755632 2016-09-07 02 52 35 United States Government Work Uncategorized 2016 December 20 | ||||
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